2002•Materials Science and Engineering BRequires access

Scanning Kelvin probe and surface photovoltage analysis of multicrystalline silicon

A. Castaldini, Daniela Cavalcoli, A. Cavallini, Marco Rossi

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Key concepts: Surface photovoltage, Wafer, Kelvin probe force microscope, Materials science, Characterization (materials science), Crystalline silicon, Volta potential, Photovoltaic system

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