Development and evaluation of a selenium-based flat-panel digital x-ray detector system based on quality factor

Nowadays, large area, flat panel solid state detectors are being investigated for digital radiography. In this paper, development and evaluation of a selenium-based flat-panel digital x-ray detector are described. The prototype detector has a pixel pitch of 139μm and a total active imaging area of 7"× 8.5", giving a total of 1.9 million pixel. This detector include a x-ray imaging layer of amorphous selenium as a photoconductor which is evaporated in vacuum state on a TFT flat panel, to make signals in proportion to incident x-ray. The film thickness was about 500μm. To evaluate the imaging performance of the digital radiography (DR) system developed in our group, sensitivity, linearity of the response of exposure, the modulation transfer function (MTF) and detective quantum efficiency (DQE) of detector was measured. The measured sensitivity was 4.16 x 106 ehp/pixel•mR at the bias field of 10 V/μm: The beam condition was 41.9 KeV. Measured MTF at 2.5 lp/mm was 52%, and the DQE at 1.5 lp/mm was 75%. And the excellent linearity was showed where the coefficient of determination (r2) is 0.9693.