Heavy carbon doping in metalorganic chemical vapor deposition for GaAs using a low V/III ratio
Mitsuhiro Kushibe, Kazuhiro Eguchi, Masahisa Funamizu, Yasuo Ohba
Abstract
Mitsuhiro Kushibe, Kazuhiro Eguchi, Masahisa Funamizu, Yasuo Ohba
Abstract
Heavily carbon-doped GaAs was obtained by low-pressure metalorganic chemical vapor deposition by using trimethylgallium and arsine with a low V/III ratio. The hole concentration became as high as 2×1019 cm−3 without using intentional doping source gases when the V/III ratio was decreased to 2.4. The hole concentration coincided with the carbon concentration measured by secondary-ion mass spectroscopy. The epilayer surface tended to be rough when the V/III ratio was decreased below 10. However, when the V/III ratio was lowered to 2.4, the epilayer surface became completely mirror-like.
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Heavily carbon-doped GaAs was obtained by low-pressure metalorganic chemical vapor deposition by using trimethylgallium and arsine with a low V/III ratio. The hole concentration became as high as 2×1019 cm−3 without using intentional doping source gases when the V/III ratio was decreased to 2.4. The hole concentration coincided with the carbon concentration measured by secondary-ion mass spectroscopy. The epilayer surface tended to be rough when the V/III ratio was decreased below 10. However, when the V/III ratio was lowered to 2.4, the epilayer surface became completely mirror-like.
Key concepts: Trimethylgallium, Arsine, Chemical vapor deposition, Analytical Chemistry (journal), Doping, Carbon fibers, Metalorganic vapour phase epitaxy, Chemistry