ScholarLens Back to search
1999•Surface and Interface AnalysisRequires access

AFM as a surface probe—beyond structural information

Chunli Bai, Junwei Li, Zhang Lin, Jing Tang, Chen Wang

Open publisher page 4 citations

Abstract

We provide a general introduction to the recent progress made in microscopic studies using scanning force microscopy (SFM). The effects associated with adhesion, friction and lateral forces are analysed and utilized as a means of characterizing surface properties. It is demonstrated that contact mode atomic force microscopy (AFM) could be used to study quantitatively the friction of domains of molecular thin films, whereas tapping mode AFM is used to reveal the elastic behaviour of monodispersed polymer globules. Copyright © 1999 John Wiley & Sons, Ltd.

About this research paper

What this paper is about

We provide a general introduction to the recent progress made in microscopic studies using scanning force microscopy (SFM). The effects associated with adhesion, friction and lateral forces are analysed and utilized as a means of characterizing surface properties. It is demonstrated that contact mode atomic force microscopy (AFM) could be used to study quantitatively the friction of domains of molecular thin films, whereas tapping mode AFM is used to reveal the elastic behaviour of monodispersed polymer globules. Copyright © 1999 John Wiley & Sons, Ltd.

Why it matters

OpenAlex reports 4 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Available abstract

We provide a general introduction to the recent progress made in microscopic studies using scanning force microscopy (SFM). The effects associated with adhesion, friction and lateral forces are analysed and utilized as a means of characterizing surface properties. It is demonstrated that contact mode atomic force microscopy (AFM) could be used to study quantitatively the friction of domains of molecular thin films, whereas tapping mode AFM is used to reveal the elastic behaviour of monodispersed polymer globules. Copyright © 1999 John Wiley & Sons, Ltd.

Key concepts: Atomic force microscopy, Scanning Force Microscopy, Adhesion, Nanotechnology, Materials science, Surface (topology), Polymer, Surface force

Related papers

Related paper 1Related paper 2Related paper 3
Back to paper searchBrowse research topicsOriginal source
AFM as a surface probe—beyond structural information — Research Paper | ScholarLens