2013•Chinese Science Bulletin (Chinese Version)Requires access
基于qPlus技术的扫描探针显微学研究进展
XiaoHui QIU, ZhiHai CHENG, Pengcheng Chen, Jun ZHANG, BingKai YUAN
Open publisher page 0 citations
Abstract
Compared with scanning tunneling microscopy (STM), atomic force microscopy (AFM) can be used to investigate both conductive and non-conductive samples through measuring the interaction forces between the atomic force sensor and the sample surface. In the past few years, the performance of AFM has been greatly improved after the invention of qPlus-AFM with the latest qPlus tuning fork based atomic force sensor. In this review, we give a brief introduction to the qPlus technique and the latest research progress of qPlus-AFM based AFM. Some comments on the future development of qPlus probe technique are also given.