Atomic Force Microscopy of DNA and Protein-DNA Complexes Using Functionalized Mica Substrates
Yuri L. Lyubchenko, Alexander A. Gall, Luda S. Shlyakhtenko
Abstract
Yuri L. Lyubchenko, Alexander A. Gall, Luda S. Shlyakhtenko
Abstract
Atomic force microscopy (AFM; also called scanning force microscopy [SFM]) is a rather novel technique that offers unique advantages in the potential for the very high resolution of DNA and small ligands in the absence of stains, shadows, and labels (,). Furthermore, the scanning can be performed in air or liquid. The latter is particularly important for resolving fully hydrated structures. The AFM is theoretically capable of resolving structural details at the level of atomic dimensions, provided that the specimen is not dynamic.
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Atomic force microscopy (AFM; also called scanning force microscopy [SFM]) is a rather novel technique that offers unique advantages in the potential for the very high resolution of DNA and small ligands in the absence of stains, shadows, and labels (,). Furthermore, the scanning can be performed in air or liquid. The latter is particularly important for resolving fully hydrated structures. The AFM is theoretically capable of resolving structural details at the level of atomic dimensions, provided that the specimen is not dynamic.
Key concepts: Mica, Scanning Force Microscopy, Atomic force microscopy, Nanotechnology, Microscopy, Conductive atomic force microscopy, Resolution (logic), Materials science