2009•Physica B Condensed MatterRequires access

Characterization of photovoltage evolution of ZnO films using a scanning Kelvin probe system

Wei Li, Chun-Te Wu, Wenzhen Qin, G.C. Wang, S.Q. Lu, Xili Dong, Hongbiao Dong, Qingyu Sun

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Key concepts: Kelvin probe force microscope, Surface photovoltage, Work function, Volta potential, Characterization (materials science), Materials science, Work (physics), Time evolution

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