2006•Journal of Electron Spectroscopy and Related PhenomenaRequires access

Direct comparison of photoemission spectroscopy and in situ Kelvin probe work function measurements on indium tin oxide films

M. M. Beerbom, B. Lägel, A. Cascio, Brian Doran, R. Schlaf

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Key concepts: Kelvin probe force microscope, Work function, Volta potential, Analytical Chemistry (journal), Inverse photoemission spectroscopy, Chemistry, Indium tin oxide, Photoemission spectroscopy