2008•Bulletin of the American Physical SocietyRequires access

Atomic scale contact formation: A combined Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) study

Till Hagedorn, Mehdi El Ouali, Yoichi Miyahara, Peter Gr utter

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Key concepts: Atomic force microscopy, Conductive atomic force microscopy, Scanning tunneling microscope, Atomic units, Photoconductive atomic force microscopy, Materials science, Nanotechnology, Kelvin probe force microscope

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Atomic scale contact formation: A combined Scanning Tunneling Microscopy (STM) and Atomic Force Microscopy (AFM) study — Research Paper | ScholarLens