Gernot Friedbacher
Abstract
Atomic Force Microscopy (AFM) Principles Instrumentation Applications Scanning Tunneling Microscopy (STM) Principles Instrumentation Lateral and spectroscopic information Applications
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Atomic Force Microscopy (AFM) Principles Instrumentation Applications Scanning Tunneling Microscopy (STM) Principles Instrumentation Lateral and spectroscopic information Applications
Key concepts: Instrumentation (computer programming), Scanning tunneling microscope, Scanning probe microscopy, Atomic force microscopy, Scanning Force Microscopy, Microscopy, Scanning ion-conductance microscopy, Nanotechnology