Error Model (EM)―A New Way of Doing Fault Simulation

This paper introduces the concept of error model (EM) that replaces a traditional fault-model-based simulation. EM is a temporal simulation of fault symptoms in an application processor. This paper shows that the application resiliency metrics, such as fault coverage, derived through EM are more comprehensive and accurate than those derived through empirical models like single stuck-at faults. In addition, EM can be used on high-level simulation models (behavioral RTL, emulation or in some cases in-silicon). EM approach gives greater than three orders of performance improvement over gate netlist models using stuck-at fault simulation. This paper shows that the coverage metrics, for a billion-logic-gate GPU design, obtained through in-silicon EM closely match the corresponding coverage metrics estimated from a low-level netlist with single stuck-at fault simulation.