A Survey of Basic Instrument Components Used in Spectroscopy, Part 3: Atomic Spectroscopy
Jerome Workman
Abstract
Jerome Workman
Abstract
In this Part 3 survey article of atomic spectroscopy instrument components, we look at instrument components and subassemblies used for the special components and terms used in atomic spectroscopy instrumentation for inductively coupled plasma–mass spectrometry (ICP-MS), ICP–optical emission spectrometry (ICP-OES), X-ray fluorescence (XRF), energy-dispersive X-ray spectroscopy (EDX), total reflection X-ray fluorescence (TXRF), and laser-induced breakdown spectroscopy (LIBS). Our “under the hood” look continues as we survey the most typical atomic spectroscopy design components. As we continue publishing our four-part component survey series, we note that tutorial articles, and The Spectroscopy Instrument Components Terminology Guide, posted digitally in February 2022, are available to our readers.
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In this Part 3 survey article of atomic spectroscopy instrument components, we look at instrument components and subassemblies used for the special components and terms used in atomic spectroscopy instrumentation for inductively coupled plasma–mass spectrometry (ICP-MS), ICP–optical emission spectrometry (ICP-OES), X-ray fluorescence (XRF), energy-dispersive X-ray spectroscopy (EDX), total reflection X-ray fluorescence (TXRF), and laser-induced breakdown spectroscopy (LIBS). Our “under the hood” look continues as we survey the most typical atomic spectroscopy design components. As we continue publishing our four-part component survey series, we note that tutorial articles, and The Spectroscopy Instrument Components Terminology Guide, posted digitally in February 2022, are available to our readers.
Key concepts: Spectroscopy, Atomic spectroscopy, Analytical Chemistry (journal), Laser-induced breakdown spectroscopy, Instrumentation (computer programming), Fluorescence spectroscopy, Mass spectrometry, Inductively coupled plasma atomic emission spectroscopy