Elimination of the broadening in X-ray diffraction lines profile for nanoparticles by using the analysis of diffraction lines method

In this research, the results of the Integral breadth method were used to analyze the X-ray lines to determine the crystallite size and lattice strain of the zirconium oxide nanoparticles and the value of the crystal size was equal to (8.2nm) and the lattice strain (0.001955), and then the results were compared with three other methods, which are the Scherer and Scherer dynamical diffraction theory and two formulas of the Scherer and Wilson method. the results were as follows Scherer crystallite size(7.4nm) and lattice strain (0.011968), Scherrer dynamic method crystallite size (7.5 nm) Scherrer and Wilson method crystallite size (8.5nm) and, lattice strain (0.001919) and, using another formula for Scherrer and Wilson method we obtain the size of the crystal (8.9nm). The difference in the results calculated for each of these methods was observed in this study.