2021•Transactions on Electrical and Electronic MaterialsRequires access

A Novel Approach to Analyze the Resistance of the RRAM Based on the Conductive Nano Filament Length and Width Variation

H. M. Vijay, V. N. Ramakrishnan

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Key concepts: Materials science, Resistive random-access memory, Protein filament, Nano-, Variation (astronomy), Electrical conductor, Composite material, Engineering physics

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A Novel Approach to Analyze the Resistance of the RRAM Based on the Conductive Nano Filament Length and Width Variation — Research Paper | ScholarLens