2011•Unpublished venueOpen access
Characterisation of powders samples by scanning eletronic microscopy (SEM), diffraction of X-rays and particle size
Constanta Ittu, Cristiana-Zizi Rizescu, Elena Valentina Stoian, Dan Nicolae Ungureanu, Zorica Bacinschi, Poinescu Aurora
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Abstract
Analytical instruments such as Scanning Electron Microscope (SEM) and X-ray diffractometer (XRD) are widely used in the area of materials research to make an indepth analysis of the various phenomena involved in the development of new materials and diagnosing failure problems. One of the areas where SEM and XRD are now heavily used is the microstructural analysis of powders.