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2016•Unpublished venueOpen access

Scanning Electron Microscopy (SEM) Procedure for HE Powders on a LEO 438VP System

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States), Fowzia Zaka, USDOE

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Abstract

This method describes the characterization of HE powders by Scanning Electron Microscopy (SEM). HE particles are dispersed onto an aluminum standard SEM specimen mount. Electron micrographs are collected at various magnifications (150 to 10,000 X) depending on HE particle size.

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What this paper is about

This method describes the characterization of HE powders by Scanning Electron Microscopy (SEM). HE particles are dispersed onto an aluminum standard SEM specimen mount. Electron micrographs are collected at various magnifications (150 to 10,000 X) depending on HE particle size.

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Available abstract

This method describes the characterization of HE powders by Scanning Electron Microscopy (SEM). HE particles are dispersed onto an aluminum standard SEM specimen mount. Electron micrographs are collected at various magnifications (150 to 10,000 X) depending on HE particle size.

Key concepts: Scanning electron microscope, Materials science, Characterization (materials science), Particle (ecology), Micrograph, Electron microscope, Particle size, Morphology (biology)

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