2011•Chinese Journal of Mechanical EngineeringRequires access

Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector

Wenhua Chen

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Key concepts: Reliability (semiconductor), Reliability engineering, Aerospace, Degradation (telecommunications), Cable gland, Test data, Computer science, Engineering

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Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector — Research Paper | ScholarLens