2009•International Conference on Computers and Devices for CommunicationRequires access

Investigation of robustness and performance comparisons of 3T - 4T DG-FinFETs for ultra low power subthreshold logic

Vaddi, Dasgupta, Agarwal

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Key concepts: Subthreshold conduction, Robustness (evolution), Logic gate, Logic level, Ultra low power, Pass transistor logic, Electronic engineering, Computer science

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Investigation of robustness and performance comparisons of 3T - 4T DG-FinFETs for ultra low power subthreshold logic — Research Paper | ScholarLens