A Novel Approach to Inactivate the Body p-i-n Diode of SiC MOSFET by Using the Normally-OFF JFET
Ping Li, Jingwei Guo, Zhi Wei Lin, Shengdong Hu, Cong Shi, Fang Tang
Abstract
Ping Li, Jingwei Guo, Zhi Wei Lin, Shengdong Hu, Cong Shi, Fang Tang
Abstract
A novel approach to inactivate the body p-i-n diode of silicon carbide (SiC) MOSFET is proposed in this article. It features a normally-OFF JFET structure embedded medially between the two p-well regions in the z-direction. When the SiC MOSFET operates in the first quadrant, the normally-OFF JFET is pinched-off, guaranteeing the excellent fundamental performance of the SiC MOSFET. While when the SiC MOSFET serves as the freewheeling diode, the channel of the normally-OFF JFET is turned on, which provides a unipolar current conduction path with low cut-in voltage, thereby inactivating the body p-i-n diode. TCAD simulation results show that, in comparison with the double trench SiC MOSFET, the cut-in voltage and the reverse recovery charge of the proposed SiC MOSFET could be reduced by 51.6% and 52.2%, respectively.
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A novel approach to inactivate the body p-i-n diode of silicon carbide (SiC) MOSFET is proposed in this article. It features a normally-OFF JFET structure embedded medially between the two p-well regions in the z-direction. When the SiC MOSFET operates in the first quadrant, the normally-OFF JFET is pinched-off, guaranteeing the excellent fundamental performance of the SiC MOSFET. While when the SiC MOSFET serves as the freewheeling diode, the channel of the normally-OFF JFET is turned on, which provides a unipolar current conduction path with low cut-in voltage, thereby inactivating the body p-i-n diode. TCAD simulation results show that, in comparison with the double trench SiC MOSFET, the cut-in voltage and the reverse recovery charge of the proposed SiC MOSFET could be reduced by 51.6% and 52.2%, respectively.
Key concepts: JFET, MOSFET, Silicon carbide, Diode, Optoelectronics, Materials science, Trench, Electrical engineering