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2020•Microelectronics ReliabilityRequires access

CHARM facility remotely controlled platform at CERN: A new fault-tolerant redundant architecture

Andrea Toscani, Danilo Santoro, Nicola Delmonte, P. Cova, Carlo Concari, A. Lanza

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Key concepts: Firmware, Fault (geology), Fault tolerance, Interconnection, Converters, Computer science, Engineering, Embedded system

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CHARM facility remotely controlled platform at CERN: A new fault-tolerant redundant architecture — Research Paper | ScholarLens