Recent advances of scanning electrochemical microscopy and scanning ion conductance microscopy for single-cell analysis
Junjie Zhang, Tong Zhu, Jinxin Lang, Wenxuan Fu, Fei Li
Abstract
Junjie Zhang, Tong Zhu, Jinxin Lang, Wenxuan Fu, Fei Li
Abstract
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Key concepts: Scanning ion-conductance microscopy, Scanning probe microscopy, Scanning electrochemical microscopy, Microscopy, Materials science, Nanotechnology, Characterization (materials science), Scanning capacitance microscopy