1974Proceedings annual meeting Electron Microscopy Society of AmericaRequires access

Interference Experiments with a Field Emission Electron Miscroscope

J. Münch, E. Zeitler

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Abstract

We have modified a Hitachi HU 12 electron microscope by replacing the thermionic electron gun with a field emission gun. The design principles of this gun are substantially the same as those used in the scanning microscopes developed at the University of Chicago by A. V. Crewe and his collaborators. To accommodate the field emission gun in the conventional column two differentially pumped stages were employed, assuring a vacuum of better than 2 x 10−10Torr in the tip region.

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What this paper is about

We have modified a Hitachi HU 12 electron microscope by replacing the thermionic electron gun with a field emission gun. The design principles of this gun are substantially the same as those used in the scanning microscopes developed at the University of Chicago by A. V. Crewe and his collaborators. To accommodate the field emission gun in the conventional column two differentially pumped stages were employed, assuring a vacuum of better than 2 x 10−10Torr in the tip region.

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Available abstract

We have modified a Hitachi HU 12 electron microscope by replacing the thermionic electron gun with a field emission gun. The design principles of this gun are substantially the same as those used in the scanning microscopes developed at the University of Chicago by A. V. Crewe and his collaborators. To accommodate the field emission gun in the conventional column two differentially pumped stages were employed, assuring a vacuum of better than 2 x 10−10Torr in the tip region.

Key concepts: Electron gun, Field electron emission, Field emission gun, Thermionic emission, Torr, Electron, Interference (communication), Field (mathematics)

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