2005Elsevier eBooksRequires access

MICROSCOPY TECHNIQUES | Atomic Force and Scanning Tunneling Microscopy

Lawrence A. Bottomley, Elizabeth Deibler Gadsby, Mark A. Poggi

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Key concepts: Scanning tunneling microscope, Microscopy, Conductive atomic force microscopy, Atomic force microscopy, Scanning ion-conductance microscopy, Nanotechnology, Materials science, Photoconductive atomic force microscopy

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