MICROSCOPY TECHNIQUES | Atomic Force and Scanning Tunneling Microscopy
Lawrence A. Bottomley, Elizabeth Deibler Gadsby, Mark A. Poggi
Abstract
Lawrence A. Bottomley, Elizabeth Deibler Gadsby, Mark A. Poggi
Abstract
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Key concepts: Scanning tunneling microscope, Microscopy, Conductive atomic force microscopy, Atomic force microscopy, Scanning ion-conductance microscopy, Nanotechnology, Materials science, Photoconductive atomic force microscopy