NP-Separate: A New VLSI Design Methodology for Area, Power, and Performance Optimization
Monzurul Islam Dewan, Dae Hyun Kim
Abstract
Monzurul Islam Dewan, Dae Hyun Kim
Abstract
Use of standard cells in the very-large-scale integration (VLSI) design enables very short time to market even for complex microprocessors. Thus, most VLSI layouts are designed using standard cells. In this article, we propose a new design methodology, namely, NP-Separate, to reduce the power consumption and area and increase the performance of a VLSI layout more effectively than the standard-cell-based design methodology. NP-Separate uses N cells and P cells composed of NFETs and PFETs only, respectively, thereby providing a higher degree of flexibility than using standard cells. Our simulation results for several benchmark circuits show that NP-Separate reduces the layout area by 9%, power consumption by 10%, power-delay product by 18%, and energy-delay product by 26% on average while satisfying given timing constraints compared to standard-cell-based designs.
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Use of standard cells in the very-large-scale integration (VLSI) design enables very short time to market even for complex microprocessors. Thus, most VLSI layouts are designed using standard cells. In this article, we propose a new design methodology, namely, NP-Separate, to reduce the power consumption and area and increase the performance of a VLSI layout more effectively than the standard-cell-based design methodology. NP-Separate uses N cells and P cells composed of NFETs and PFETs only, respectively, thereby providing a higher degree of flexibility than using standard cells. Our simulation results for several benchmark circuits show that NP-Separate reduces the layout area by 9%, power consumption by 10%, power-delay product by 18%, and energy-delay product by 26% on average while satisfying given timing constraints compared to standard-cell-based designs.
Key concepts: Very-large-scale integration, Benchmark (surveying), Standard cell, Flexibility (engineering), Computer science, Power consumption, Power (physics), Reliability engineering