Polarized Raman imaging of large area aligned semiconducting single‐walled carbon nanotubes

Abstract The current method of characterizing single‐walled carbon nanotube (SWCNT) alignment utilizes single‐point measurements of a few hundred square nanometers of polarized Raman spectroscopy to characterize an entire substrate of SWCNTs on the order of square centimeters. In this study, we demonstrate a new polarized Raman spectroscopy analyzation technique of orientation Raman imaging that images areas as large as 1 mm2. This provides a significantly more accurate representation of the spatial distribution in the alignment of any SWCNT film by increasing the measured area by 10 orders of magnitude over previous standard characterization techniques. Furthermore, this creates an “easy‐to‐see” visual representation of alignment based on optical anisotropy values. Improving the efficiency of characterizing alignment in SWCNT films via polarized Raman spectroscopy is an important step toward manufacturing scalable films of aligned SWCNTs.