The Moving Finger Writes: Carbon Nanotubes as AFM Probe Tips

Abstract After carbon nanotubes (CNT) were discovered in 1991, many applications have been proposed that utilize their extraordinary electrical and mechanical properties. One application is as tips for scanning probe microscopy where CNTs offer several advantages including high resolution and the capability to image deep, narrow structures. A recent study of CNT scanning probes for atomic force microscopy (AFM) in semiconductor surface science concluded that an AFM with CNT tips has immense potential as a surface characterization tool in integrated circuit manufacture. Previously researchers had to construct their own CNT probes, but recently CNT AFM probes have become commercially available. Carbon nanotubes (sometimes called buckytubes) are closed seamless shells ot graphitic carbon typically one to tens of nanometers in diameter and several micrometers long. The structure of a closed-dome single-walled nanotube is illustrated in Figure 1. Carbon nanotube probe tips offer several advantages.