2011•ASME Press eBooksRequires access

Efficient Rate-Compatible Puncturing Scheme for Low-Density Parity-Check Codes

Fuli Ma, Lijun Zhang

Abstract

An efficient rate-compatible (RC) puncturing scheme for LDPC codes is proposed, which tries to distribute the punctured bits as evenly as possible while maximizing the number of 1-SR nodes in Tanner graph. The puncturing scheme can produce RC LDPC with rates ranging from the mother code rate through even 1. Simulation results show that the new puncturing method is superior to random puncturing and the method in [2].

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Available abstract

Key concepts: Puncturing, Tanner graph, Low-density parity-check code, Scheme (mathematics), Computer science, Mathematics, Code (set theory), Algorithm