2019•Unpublished venueRequires access
SOC Design for Testability (DFT)
Veena S. Chakravarthi
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Abstract
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Veena S. Chakravarthi
Abstract
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OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.
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Key concepts: Design for testing, Testability, Automatic test pattern generation, Computer science, Context (archaeology), Reliability engineering, Computer architecture, Engineering