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2019•Unpublished venueRequires access

Testability Measures Considering Circuit Reconvergence to Reduce ATPG Runtime

Kai-Hsun Chen, Ching-Yuan Chen, Jiun-Lang Huang

Open publisher page 6 citations

Abstract

Reconvergence has been recognized as the main reason for ATPG backtrack. It induces not only more, but also prolonged backtracks and causes more severe performance degradation than expected. In this paper, we propose a reconvergence-aware testability measure to better guide the ATPG justification process. Experiment results show that the proposed method significantly decreases the ATPG runtime, especially for circuits with deep logic level, by up to 76%.

About this research paper

What this paper is about

Reconvergence has been recognized as the main reason for ATPG backtrack. It induces not only more, but also prolonged backtracks and causes more severe performance degradation than expected. In this paper, we propose a reconvergence-aware testability measure to better guide the ATPG justification process. Experiment results show that the proposed method significantly decreases the ATPG runtime, especially for circuits with deep logic level, by up to 76%.

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OpenAlex reports 6 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Reconvergence has been recognized as the main reason for ATPG backtrack. It induces not only more, but also prolonged backtracks and causes more severe performance degradation than expected. In this paper, we propose a reconvergence-aware testability measure to better guide the ATPG justification process. Experiment results show that the proposed method significantly decreases the ATPG runtime, especially for circuits with deep logic level, by up to 76%.

Key concepts: Testability, Automatic test pattern generation, Computer science, Design for testing, Process (computing), Combinational logic, Sequential logic, Parallel computing

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