2019JSTS Journal of Semiconductor Technology and ScienceRequires access

An 11-bit 50-MS/s Pipelined ADC using Circuit-sharing Techniques

Seungheun Song, Chulkyu Park, Joongho Choi

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Abstract

In this paper, an 11-bit 50-MS/s analog-todigital converter (ADC) is presented. The sampleand-hold amplifier (SHA) and the first multiplying digital-to-analog converter (MDAC) can be efficiently combined with the proposed operational amplifier and capacitor sharing technique. In addition, the offset voltage and gain error of the operational amplifier can be reduced. The number of flash analog-to-digital converters (FADCs) can be halved by sharing comparators between the adjacent stages. The prototype ADC implemented in a 65-nm CMOS process achieves a signal-to-noise and distortion ratio of 60.7 dB and spurious-free dynamic range of 69.5 dB. The measured differential and integral nonlinearities are within ±0.6 LSB and ±1.1 LSB, respectively. The ADC occupies an active die area of 0.62 ㎟ and consumes 10.8 mW for a supply voltage of 1.2 V. The figure of merit is 242 fJ/conversion-step.

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What this paper is about

In this paper, an 11-bit 50-MS/s analog-todigital converter (ADC) is presented. The sampleand-hold amplifier (SHA) and the first multiplying digital-to-analog converter (MDAC) can be efficiently combined with the proposed operational amplifier and capacitor sharing technique. In addition, the offset voltage and gain error of the operational amplifier can be reduced. The number of flash analog-to-digital converters (FADCs) can be halved by sharing comparators between the adjacent stages. The prototype ADC implemented in a 65-nm CMOS process achieves a signal-to-noise and distortion ratio of 60.7 dB and spurious-free dynamic range of 69.5 dB. The measured differential and integral nonlinearities are within ±0.6 LSB and ±1.1 LSB, respectively. The ADC occupies an active die area of 0.62 ㎟ and consumes 10.8 mW for a supply voltage of 1.2 V. The figure of merit is 242 fJ/conversion-step.

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Available abstract

In this paper, an 11-bit 50-MS/s analog-todigital converter (ADC) is presented. The sampleand-hold amplifier (SHA) and the first multiplying digital-to-analog converter (MDAC) can be efficiently combined with the proposed operational amplifier and capacitor sharing technique. In addition, the offset voltage and gain error of the operational amplifier can be reduced. The number of flash analog-to-digital converters (FADCs) can be halved by sharing comparators between the adjacent stages. The prototype ADC implemented in a 65-nm CMOS process achieves a signal-to-noise and distortion ratio of 60.7 dB and spurious-free dynamic range of 69.5 dB. The measured differential and integral nonlinearities are within ±0.6 LSB and ±1.1 LSB, respectively. The ADC occupies an active die area of 0.62 ㎟ and consumes 10.8 mW for a supply voltage of 1.2 V. The figure of merit is 242 fJ/conversion-step.

Key concepts: Comparator, Flash ADC, Least significant bit, Operational amplifier, Differential nonlinearity, Successive approximation ADC, Dynamic range, Capacitor

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