Mary Cooper Scott, C.C. Chen, M. Mechlenburg, Chun Zhu, Rui Dong Xu, B. C. Regan, Jianwei Miao, Peter A. Ercius, Ulrich Dahmen
Abstract
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
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Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Key concepts: Electron tomography, Resolution (logic), High-resolution transmission electron microscopy, Transmission electron microscopy, Tomography, Icosahedral symmetry, Materials science, Electron