Water vapor, by near-ambient pressure XPS
Dhananjay I. Patel, Dhruv Shah, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford
Abstract
Dhananjay I. Patel, Dhruv Shah, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford
Abstract
Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, XPS can be used to probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey and O 1s NAP-XPS spectra from water vapor, a material that could not be analyzed at moderate pressures by conventional approaches and that is expected to be present in many analyses.
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Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, XPS can be used to probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey and O 1s NAP-XPS spectra from water vapor, a material that could not be analyzed at moderate pressures by conventional approaches and that is expected to be present in many analyses.
Key concepts: X-ray photoelectron spectroscopy, Ambient pressure, Outgassing, Water vapor, Materials science, Nap, Analytical Chemistry (journal), High pressure