2019•Elsevier eBooksOpen access

Advanced modeling and characterization techniques for innovative memory devices: The RRAM case

Francesco Maria Puglisi, Andréa Sandoval Padovani, Paolo Pavan, Luca Larcher

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Key concepts: Resistive random-access memory, Characterization (materials science), Multiscale modeling, Resistive touchscreen, Computer science, Focus (optics), Electronic engineering, Engineering

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Advanced modeling and characterization techniques for innovative memory devices: The RRAM case — Research Paper | ScholarLens