Sub-30 nm patterning of molecular resists based on crosslinking through tip based oxidation
Matteo Lorenzoni, Daniel Wagner de Castro Lima Santos, Christian Neuber, Hans‐Werner Schmidt, Francesc Pérez‐Murano
Abstract
Matteo Lorenzoni, Daniel Wagner de Castro Lima Santos, Christian Neuber, Hans‐Werner Schmidt, Francesc Pérez‐Murano
Abstract
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Key concepts: Resist, Lithography, Electron-beam lithography, Nanoimprint lithography, Materials science, Nanotechnology, Nanolithography, Next-generation lithography