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2003•Microscopy TodayOpen access

Use of a New Imaging Technique to Document Deformations Recorded in the Environmental Scanning Electron Microscope

Edward F. O’Neil, Hamlin M. Jennings, Jeffrey J Thomas

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Abstract

Abstract The introduction of the environmental scanning electron microscope (ESEM) greatly Improved the functionality of scanning electron microscope (SEM) technology by allowing objects to be imaged in water-vapor under low vacuum, and without the need for coating to facilitate electrical conductivity. The low vacuum environment allows Imaging of delicate structures, such as needlelike crystals, without fear of damaging the object in the process of viewing it.

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Abstract The introduction of the environmental scanning electron microscope (ESEM) greatly Improved the functionality of scanning electron microscope (SEM) technology by allowing objects to be imaged in water-vapor under low vacuum, and without the need for coating to facilitate electrical conductivity. The low vacuum environment allows Imaging of delicate structures, such as needlelike crystals, without fear of damaging the object in the process of viewing it.

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Available abstract

Abstract The introduction of the environmental scanning electron microscope (ESEM) greatly Improved the functionality of scanning electron microscope (SEM) technology by allowing objects to be imaged in water-vapor under low vacuum, and without the need for coating to facilitate electrical conductivity. The low vacuum environment allows Imaging of delicate structures, such as needlelike crystals, without fear of damaging the object in the process of viewing it.

Key concepts: Environmental scanning electron microscope, Scanning electron microscope, Materials science, Microscope, Low-voltage electron microscope, Electron microscope, Optics, Nanotechnology

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