Secondary electron detection in the scanning transmission electron microscope
Douglas Imeson, R.H. Milne, S. D. Berger, Dennis McMullan
Abstract
Douglas Imeson, R.H. Milne, S. D. Berger, Dennis McMullan
Abstract
An abstract is not available in the OpenAlex record for this paper.
OpenAlex reports 43 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Key concepts: Scanning transmission electron microscopy, Secondary electrons, Conventional transmission electron microscope, Scanning electron microscope, Low-voltage electron microscope, Environmental scanning electron microscope, High-resolution transmission electron microscopy, Electron