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2017•Unpublished venueRequires access

Microsphere embedded in cantilever opens the AFM to high resolution optical microscopy

Francesco Tantussi, Martí Duocastella, Ali Haddadapour, Remo Proietti Zaccaria, Andrea Jacassi, Georgios Veronis, Alberto Diaspro, Francesco De Angelis

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Abstract

Summary form only given. The combination of the AFM technique and the sphere-mediated microscopy (SMM) [1] opens a new opportunity to the Atomic Force Microscopy (AFM). With the help of a tipless AFM cantilever is possible to place and scan a microspheres (MS) close to the surface. From the optical point of view, when a MS is close to a surface act as high NA nanolenses whose optical characteristics define the maximum attainable resolution.We performed a detailed measurement of the spatial resolution in SMM by imaging a calibration target made of gratings with different periodicity. Images of the test gratings with and without the microsphere allowed a full characterization of the spatial frequency response of our microscope (modulation transfer function or MTF) and the consequent quantitative determination of the enhancement in resolution induced by the microsphere[2].

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What this paper is about

Summary form only given. The combination of the AFM technique and the sphere-mediated microscopy (SMM) [1] opens a new opportunity to the Atomic Force Microscopy (AFM). With the help of a tipless AFM cantilever is possible to place and scan a microspheres (MS) close to the surface. From the optical point of view, when a MS is close to a surface act as high NA nanolenses whose optical characteristics define the maximum attainable resolution.We performed a detailed measurement of the spatial resolution in SMM by imaging a calibration target made of gratings with different periodicity. Images of the test gratings with and without the microsphere allowed a full characterization of the spatial frequency response of our microscope (modulation transfer function or MTF) and the consequent quantitative determination of the enhancement in resolution induced by the microsphere[2].

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Available abstract

Summary form only given. The combination of the AFM technique and the sphere-mediated microscopy (SMM) [1] opens a new opportunity to the Atomic Force Microscopy (AFM). With the help of a tipless AFM cantilever is possible to place and scan a microspheres (MS) close to the surface. From the optical point of view, when a MS is close to a surface act as high NA nanolenses whose optical characteristics define the maximum attainable resolution.We performed a detailed measurement of the spatial resolution in SMM by imaging a calibration target made of gratings with different periodicity. Images of the test gratings with and without the microsphere allowed a full characterization of the spatial frequency response of our microscope (modulation transfer function or MTF) and the consequent quantitative determination of the enhancement in resolution induced by the microsphere[2].

Key concepts: Cantilever, Atomic force microscopy, Resolution (logic), Optical transfer function, Materials science, Image resolution, Microscopy, Optics

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