2017•Hyomen KagakuOpen access

Approach to Highly Sensitive XAFS by Means of Bent Crystal Laue Analyzers

Yuki Wakisaka, Yuya Iwasaki, Hiromitsu Uehara, Shingo Mukai, Daiki Kido, Satoru Takakusagi, Yohei Uemura, Takahiro Wada, Qiuyi Yuan, Oki Sekizawa, Tomoya Uruga, Yasuhiro Iwasawa, Kiyotaka Asakura

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Abstract

A log-spirally bent crystal Laue analyzer has been investigated and developed for highly sensitive in situ surface X-ray absorption fine structure (XAFS) measurement. Both calculations and experiments were conducted to obtain its intensity distributions on the different positions of the analyzer. A home-made log-spirally bent crystal Laue analyzer was made and evaluated. It was revealed that higher XAFS signals were obtained with the home-made analyzer than with the commercial one.

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Key concepts: X-ray absorption fine structure, Bent molecular geometry, Spectrum analyzer, Crystal (programming language), Materials science, Absorption (acoustics), Optics, Analytical Chemistry (journal)