2012•Electrical Engineering and Power EngineeringOpen access

Determination of temperature of the thyristor semiconductor structure under cyclic loading

V. S. Ostrenko, Ольга Валентиновна Василенко

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Abstract

This article focuses on the method of determination of maximum and minimum junction temperatures of the thyristors semiconductor structure operating in the mode of cyclically varying loads. This allows to determine the maximum value of current through the thyristor and to determine the approximate value of the duration of the thyristors under cyclic loading.

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What this paper is about

This article focuses on the method of determination of maximum and minimum junction temperatures of the thyristors semiconductor structure operating in the mode of cyclically varying loads. This allows to determine the maximum value of current through the thyristor and to determine the approximate value of the duration of the thyristors under cyclic loading.

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Available abstract

This article focuses on the method of determination of maximum and minimum junction temperatures of the thyristors semiconductor structure operating in the mode of cyclically varying loads. This allows to determine the maximum value of current through the thyristor and to determine the approximate value of the duration of the thyristors under cyclic loading.

Key concepts: Thyristor, Semiconductor, Mode (computer interface), Value (mathematics), Integrated gate-commutated thyristor, Materials science, Semiconductor device, Control theory (sociology)

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