Determination of temperature of the thyristor semiconductor structure under cyclic loading
V. S. Ostrenko, Ольга Валентиновна Василенко
Abstract
Open-access reader
V. S. Ostrenko, Ольга Валентиновна Василенко
Abstract
Open-access reader
This article focuses on the method of determination of maximum and minimum junction temperatures of the thyristors semiconductor structure operating in the mode of cyclically varying loads. This allows to determine the maximum value of current through the thyristor and to determine the approximate value of the duration of the thyristors under cyclic loading.
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This article focuses on the method of determination of maximum and minimum junction temperatures of the thyristors semiconductor structure operating in the mode of cyclically varying loads. This allows to determine the maximum value of current through the thyristor and to determine the approximate value of the duration of the thyristors under cyclic loading.
Key concepts: Thyristor, Semiconductor, Mode (computer interface), Value (mathematics), Integrated gate-commutated thyristor, Materials science, Semiconductor device, Control theory (sociology)