2017•NASA Technical Reports Server (NASA)Requires access

Characterization of System Level Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

Melanie D. Berg, Kenneth A. LaBel, Michael J. Campola, M.A. Xapsos

Abstract

We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment data.

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Available abstract

Key concepts: Single event upset, Upset, Reliability (semiconductor), Event (particle physics), Computer science, Domain (mathematical analysis), Reliability engineering, Space (punctuation)