2013•The Japan Society of Applied PhysicsRequires access

Atomic resolution imaging of the local contact potential difference with kelvin probe force microscopy without the dc bias voltage

Ryosuke Kanbayashi

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Key concepts: Kelvin probe force microscope, Volta potential, Materials science, Non-contact atomic force microscopy, Atomic force microscopy, Microscopy, Biasing, Conductive atomic force microscopy

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Atomic resolution imaging of the local contact potential difference with kelvin probe force microscopy without the dc bias voltage — Research Paper | ScholarLens