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2011•ECS Meeting AbstractsOpen access

Characterization of Nickel Germanide Schottky Contacts for the Fabrication of Ge p-MOSFETs

Durga Gajula, David McNeill, Mervyn Armstrong

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Key concepts: Germanide, Fabrication, Characterization (materials science), Materials science, Nickel, Schottky diode, Optoelectronics, Germanium

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