B22-P-09The misorientation change in lenticular martensite by Electron Backscattered Diffraction and Convergent Beam Kikuchi Line Diffraction Pattern
Ya-Ling Chang, Yu-Ting Tsai, Po‐Yu Chen, Jer‐Ren Yang
Abstract
Ya-Ling Chang, Yu-Ting Tsai, Po‐Yu Chen, Jer‐Ren Yang
Abstract
In this study, the two techniques, Convergent Beam Kikuchi Line Diffraction Patterns (CBKLDP) in TEM and Electron Backscatter Diffraction (EBSD) in SEM, are used to investigate the crystal orientation relationships in lenticular martensite. These two techniques can provide information on different aspects of the crystal orientation and more details of the crystallography. The Kikuchi pattern of crystal is the core knowledge of the two techniques. Analysis with EBSD and CBKLDP shows that in a lenticular martensite grain, the misorientation changes in different regions, and the range of this variation is about 3°.
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In this study, the two techniques, Convergent Beam Kikuchi Line Diffraction Patterns (CBKLDP) in TEM and Electron Backscatter Diffraction (EBSD) in SEM, are used to investigate the crystal orientation relationships in lenticular martensite. These two techniques can provide information on different aspects of the crystal orientation and more details of the crystallography. The Kikuchi pattern of crystal is the core knowledge of the two techniques. Analysis with EBSD and CBKLDP shows that in a lenticular martensite grain, the misorientation changes in different regions, and the range of this variation is about 3°.
Key concepts: Electron backscatter diffraction, Misorientation, Kikuchi line, Materials science, Electron diffraction, Diffraction, Optics, Martensite