2004•Applied Surface ScienceRequires access

Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)

Hubert Gnaser, Robin Golser, W. Kutschera, Alfred Priller, Peter Steier, Christof Vockenhuber

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Key concepts: Mass spectrometry, Accelerator mass spectrometry, Chemistry, Fragmentation (computing), Static secondary-ion mass spectrometry, Secondary ion mass spectrometry, Ion, Mass spectrum

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Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS) — Research Paper | ScholarLens