N. Maragkos, Mira Naftaly, A.P. Foulds, Mark R. Stringer, R.E. Miles, Alexander Giles Davies
Abstract
We describe a terahertz reflection system designed to perform both specular and diffuse reflection measurements and to switch easily between the two configurations. Some results from both types of measurement are shown.
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We describe a terahertz reflection system designed to perform both specular and diffuse reflection measurements and to switch easily between the two configurations. Some results from both types of measurement are shown.
Key concepts: Specular reflection, Terahertz radiation, Diffuse reflection, Reflection (computer programming), Diffuse reflectance infrared fourier transform, Optics, Reflectivity, Materials science