Absolute measurement of diffuse and specular reflectance using an FTIR spectrometer with an integrating sphere
Robert A. Shepherd
Abstract
Robert A. Shepherd
Abstract
A novel method for the absolute measurement of both diffuse and specular reflectance using a Fourier transform infrared spectrophotometer with an integrating sphere is presented. By mounting the sample in the center and referencing off the wall of the sphere, total and diffuse reflectance measurements can be made without having to use a reference sample. The specular reflectance is then calculated as the difference between the total and diffuse curves.
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A novel method for the absolute measurement of both diffuse and specular reflectance using a Fourier transform infrared spectrophotometer with an integrating sphere is presented. By mounting the sample in the center and referencing off the wall of the sphere, total and diffuse reflectance measurements can be made without having to use a reference sample. The specular reflectance is then calculated as the difference between the total and diffuse curves.
Key concepts: Specular reflection, Diffuse reflection, Integrating sphere, Diffuse reflectance infrared fourier transform, Optics, Materials science, Spectrometer, Fourier transform