2016•Microelectronics ReliabilityRequires access

Fatigue life prediction model for accelerated testing of electronic components under non-Gaussian random vibration excitations

Yu Jiang, Jinglei Tao, Y.A. Zhang, Gun Jin Yun

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Key concepts: Vibration fatigue, Random vibration, Kurtosis, Vibration, Gaussian, Spectral density, Structural engineering, Reliability (semiconductor)

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