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2014•Unpublished venueRequires access

Pilot Testing of SHRP 2 Reliability Data and Analytical Products: Florida Pilot Site

Mohammed Hadi, Yan Xiao, Tao Wang, Pei Hu, Jia Jian-min, Robert Edelstein, Alexandra Lopez

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Key concepts: Reliability (semiconductor), Reliability engineering, Engineering, Quantum mechanics, Power (physics), Physics

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