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2014•Unpublished venueRequires access

Pilot Testing of SHRP 2 Reliability Data and Analytical Products: Southern California Pilot Site

Chris Williges, Bill McCullough, Yu Ying Chu, Naresh Amatya, Ryan Kuo, Margaret Lin, Lianyu Chu

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Key concepts: Reliability (semiconductor), Reliability engineering, Environmental science, Engineering, Power (physics), Physics, Quantum mechanics

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