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2009•PolyPublie (École Polytechnique de Montréal)Requires access

Characterization of powders and pm components utilizing transmission electron microscopy

Carl Blais, Gilles L’Éspérance, Philippe Plamondon

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Abstract

Characterization of the fine microstructure of materials by transmission electron microscopy (TEM) is generally perceived as a long and tedious task. It is particularly true for powder metallurgy (PM) components in which the presence of porosity makes sample preparation even more difficult. Examples are presented in which the focused ion beam technique is used to prepare PM specimens for characterization by TEM. These examples illustrate the benefits of this technique and TEM in terms of sample quality and the added information that it yields. A detailed characterization of second-phase particles in resulfurized (prealloyed) PM components is presented.

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What this paper is about

Characterization of the fine microstructure of materials by transmission electron microscopy (TEM) is generally perceived as a long and tedious task. It is particularly true for powder metallurgy (PM) components in which the presence of porosity makes sample preparation even more difficult. Examples are presented in which the focused ion beam technique is used to prepare PM specimens for characterization by TEM. These examples illustrate the benefits of this technique and TEM in terms of sample quality and the added information that it yields. A detailed characterization of second-phase particles in resulfurized (prealloyed) PM components is presented.

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Available abstract

Characterization of the fine microstructure of materials by transmission electron microscopy (TEM) is generally perceived as a long and tedious task. It is particularly true for powder metallurgy (PM) components in which the presence of porosity makes sample preparation even more difficult. Examples are presented in which the focused ion beam technique is used to prepare PM specimens for characterization by TEM. These examples illustrate the benefits of this technique and TEM in terms of sample quality and the added information that it yields. A detailed characterization of second-phase particles in resulfurized (prealloyed) PM components is presented.

Key concepts: Characterization (materials science), Transmission electron microscopy, Materials science, Microstructure, Powder metallurgy, Focused ion beam, Sample preparation, Porosity

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